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A Designer's Guide to Built-in Self-Test (Frontiers in Electronic Testing)
A Designer's Guide to Built-in Self-Test (Frontiers in Electronic Testing)
Date: 14 April 2011, 15:12

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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.

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