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A Designer's Guide to Built-in Self-Test (Frontiers in Electronic Testing) [Repost]
A Designer's Guide to Built-in Self-Test (Frontiers in Electronic Testing) [Repost]
Date: 24 November 2010, 15:40

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A Designer's Guide to Built-in Self-Test (Frontiers in Electronic Testing)
by Charles E. Stroud
Springer | 2002 | ISBN: 1402070500 | Pages: 344 | PDF | Size: 15,65 MB

“A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.”
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