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Trap Level Spectroscopy in Amorphous Semiconductors
Trap Level Spectroscopy in Amorphous Semiconductors
Date: 12 November 2010, 05:49

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Trap Level Spectroscopy in Amorphous Semiconductors By Victor V. Mikla, Victor I Mikla
Publisher: Elsevier 2010 | 128 Pages | ISBN: 012384715X | PDF | 2 MB


Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages.
  • Provides information on the most common spectroscopic techniques
  • Discusses the advantages and disadvantages of each technique







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Spectroscopy   Trap   Level   Amorphous  

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