Sign In | Not yet a member? | Submit your article
 
Home   Technical   Study   Novel   Nonfiction   Health   Tutorial   Entertainment   Business   Magazine   Arts & Design   Audiobooks & Video Training   Cultures & Languages   Family & Home   Law & Politics   Lyrics & Music   Software Related   eBook Torrents   Uncategorized  
Letters: A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

Semiconductor Material and Device Characterization
Semiconductor Material and Device Characterization
Date: 11 April 2011, 21:06

Free Download Now     Free register and download UseNet downloader, then you can FREE Download from UseNet.

    Download without Limit " Semiconductor Material and Device Characterization " from UseNet for FREE!
Product Description: Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques.
This newly revamped and expanded Second Edition incorporates the many innovations that have come to dominate the field during the past decade. From scanning probe techniques to the detection of metallic impurities in silicon wafers to the use of microwave reflection to measure contactless resistivity, each chapter presents state-of-the-art tools and techniques, most of which were in their infancy or had not yet been developed when the previous edition first came out. Featured here are:
* An entirely new chapter on reliability and probe microscopy
* Numerous examples and end-of-chapter problems - new to this edition
* Five hundred illustrations revised for this edition
* Updated bibliography with over 1,200 references
* Easy-to-use text including a real-world mix of units rather than strictly MKS units.
This practical new edition is ideal for textbook adoptions at the graduate level and is destined to become an essential reference for research and development teams in the semiconductor industry.

DISCLAIMER:

This site does not store Semiconductor Material and Device Characterization on its server. We only index and link to Semiconductor Material and Device Characterization provided by other sites. Please contact the content providers to delete Semiconductor Material and Device Characterization if any and email us, we'll remove relevant links or contents immediately.



Comments

Comments (0) All

Verify: Verify

    Sign In   Not yet a member?


Popular searches