Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures - ISBN:1441962166

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures

Date: 10 November 2010, 05:13

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Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures
Springer; 1st Edition. edition (22 Oct 2010) | ISBN: 1441962166 | 195 pages | PDF | 6 MB

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

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