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Progress in Nano-Electro Optics IV: Characterization of Nano-Optical Materials and Optical Near-Field Interactions
Progress in Nano-Electro Optics IV: Characterization of Nano-Optical Materials and Optical Near-Field Interactions
Date: 12 November 2010, 03:15

Progress in Nano-Electro Optics IV: Characterization of Nano-Optical Materials and Optical Near-Field Interactions
Publisher: Springer; 1 edition | ISBN: 3540232362 | edition 2005 | PDF | 220 pages | 4.9 mb

This second book of the trilogy Progress in Nano-Electro-Optics is a comprehensive review of the applications of optical near-field interaction with matter … . It is so clearly written that it is accessible even for undergraduate students. An extensive and updated reference list can be found at the end of each chapter, and the book includes an extended index.
This volume focuses on the characterization of nano-optical materials and optical-near field interactions. It begins with the techniques for characterizing the magneto-optical Kerr effect and continues with methods to determine structural and optical properties in high-quality quantum wires with high spatial uniformity. Further topics include: near-field luminescence mapping in InGaN/GaN single quantum well structures in order to interpret the recombination mechanism in InGaN-based nano-structures; and theoretical treatment of the optical near field and optical near-field interactions, providing the basis for investigating the signal transport and associated dissipation in nano-optical devices. Taken as a whole, this overview will be a valuable resource for engineers and scientists working in the field of nano-electro-optics.
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