Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy - ISBN:1846289122

Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy

Date: 14 April 2011, 03:42

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Precision landmark location in digital images is one of those interesting problems in which industrial practice seems to outstrip the results available in the scholarly literature. Approaching this problem, we remarked that the best-performing commercial close-range photogrammetry systems have specified accuracies of a part per 100,000, which translates to 10–20 millipixels of uncertainty in locating features for measurement. At the same time, articles we identified in the academic literature didn’t seem to give any firm answer about when this level of performance is possible or how it can be achieved.

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