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Fault diagnosis of analog integrated circuits
Fault diagnosis of analog integrated circuits
Date: 13 April 2011, 14:50

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The field of integrated circuit has undergone remarkable changes over the past decade. Integrated circuits incorporating both digital and analog function have become more and more popular in semiconductor industry. These combined circuits are called “Mixed Signal Circuits”. Fault diagnosis and testing of integrated circuit has grown into a special field of interest in semiconductor industry. The methodologies for testing of digital circuits are well established. However the methodologies for fault diagnosis of analog integrated circuits are relatively unexplored. Some of the reasons for this under development are lack of proper fault model of the devices operating in the continuous time domain, multiple value of the signal at each node of the circuit, etc.

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