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Extreme Statistics in Nanoscale Memory Design
Extreme Statistics in Nanoscale Memory Design
Date: 16 April 2011, 00:14

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This book explains the problem of estimating statistics of memory performance variation induced due to IC manufacturing process variations, and provides solutions recently proposed in the Electronic Design Automation (EDA) community. The material serves as a comprehensive reference for researchers and practitioners interested in the problem of estimating extreme statistics for memories.
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