Digital Design and Fabrication
| Date: 06 May 2011, 20:21
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After nearly six years as the field's leading reference, the second edition of the award-winning Computer Engineering Handbook reemerges with completely updated content and a brand new, two-volume format. Part of this monumental revision, Digital Design and Fabrication surveys the latest advances in computer architecture and design and the technologies used to manufacture and test them. Featuring contributions from leading experts, the book also includes a new section on memory and storage as well as new chapters on semiconductor memory circuits and nonvolatile memory technologies and applications. Nearly every chapter features extensively updated information that reflects new developments, trends, standards, and technologies.
Contents
SECTION I Fabrication and Technology
1 Trends and Projections for the Future of Scaling and Future Integration Trends
2 CMOS Circuits
2.1 VLSI Circuits
2.2 Pass-Transistor CMOS Circuits
2.3 Synthesis of CMOS Pass-Transistor Logic
2.4 Silicon on Insulator
3 High-Speed, Low-Power Emitter Coupled Logic Circuits
4 Price-Performance of Computer Technology
SECTION II Memory and Storage
5 Semiconductor Memory Circuits
6 Semiconductor Storage Devices in Computing and Consumer Applications
SECTION III Design Techniques
7 Timing and Clocking
7.1 Design of High-Speed CMOS PLLs and DLLs
7.2 Latches and Flip-Flops
7.3 High-Performance Embedded SRAM
8 Multiple-Valued Logic Circuits
9 FPGAs for Rapid Prototyping
10 Issues in High-Frequency Processor Design
11 Computer Arithmetic
11.1 High-Speed Computer Arithmetic
11.2 Fast Adders and Multipliers
SECTION IV Design for Low Power
12 Design for Low Power
13 Low-Power Circuit Technologies
14 Techniques for Leakage Power Reduction
15 Dynamic Voltage Scaling
16 Lightweight Embedded Systems
17 Low-Power Design of Systems on Chip
18 Implementation-Level Impact on Low-Power Design
19 Accurate Power Estimation of Combinational CMOS Digital Circuits
20 Clock-Powered CMOS for Energy-Efficient Computing
SECTION V Testing and Design for Testability
21 System-on-Chip (SoC) Testing: Current Practices and Challenges for Tomorrow
22 Test Technology for Sequential Circuits
23 Scan Testing Chouki Aktouf
24 Computer-Aided Analysis and Forecast of Integrated Circuit Yield
Index
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