Atomic Force Microscopy - ISBN:0199570450

Atomic Force Microscopy

Date: 24 November 2010, 15:41

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Peter Eaton, "Atomic Force Microscopy"
Publisher: O-d U-y Press, USA | 2010 | ISBN: 0199570450 | PDF | 288 pages | 5.3 MB

Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

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